In Situ TEM Characterization of Nanostructured Dielectrics
Source abstract
Abstract
Ming-Siao Hsiao, Yifei Yuan, Christopher Grabowski, Anmin Nie, Reza Shabazian-Yassar, Lawrence F Drummy; In Situ TEM Characterization of Nanostructured Die
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Dielectric materials and actuators · Ferroelectric and Piezoelectric Materials · Semiconductor materials and devices
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (3)
Show source-provided references
1. 10.1021/am506521r10.1021/am506521r ↗
2. 10.1557/mrs2008.8210.1557/mrs2008.82 ↗
3. 10.3390/ma204169710.3390/ma2041697 ↗