Direct Electromagnetic Structure Observation by Aberration-corrected Differential Phase Contrast Scanning Transmission Electron Microscopy

N. Shibata; S.D. Findlay; T. Matsumoto; T. Seki; G. Sánchez-Santolino; Y. Kohno; H. Sawada; H. Sasaki; Y.G. So; R. Ishikawa; Y. Ikuhara

doi:10.1017/s1431927616005377

journal article·2016-07Open access

Direct Electromagnetic Structure Observation by Aberration-corrected Differential Phase Contrast Scanning Transmission Electron Microscopy

N. Shibata, S.D. Findlay, T. Matsumoto, T. Seki, G. Sánchez-Santolino, Y. Kohno, H. Sawada, H. Sasaki, Y.G. So, R. Ishikawa, Y. Ikuhara

Microscopy and Microanalysis· Volume 22· Issue S3

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Abstract

N Shibata, SD Findlay, T Matsumoto, T Seki, G Sánchez-Santolino, Y Kohno, H Sawada, H Sasaki, YG So, R Ishikawa, Y Ikuhara; Direct Electromagnetic Structur

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Source: openalex_inverted_index · Quality: short

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OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Magnetic properties of thin films

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