Troubleshooting Fabricated Products via Microscopic Defect and Failure Analysis
Source abstract
Abstract
Eddy Garcia-Meitin, Mridula Kapur, Rajen Patel; Troubleshooting Fabricated Products via Microscopic Defect and Failure Analysis, Microscopy and Microanalys
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Integrated Circuits and Semiconductor Failure Analysis · Advancements in Photolithography Techniques · Electron and X-Ray Spectroscopy Techniques
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References (2)
Show source-provided references
1. 1997 · 303 · 303
2. Microscopy aand Microanalysis · 2007 · 13 · 323