Correlation Averaging of Single-Atomic-Column STEM-EDX Images for Sub-Atomic Information
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Abstract
Jong Seok Jeong, K Andre Mkhoyan; Correlation Averaging of Single-Atomic-Column STEM-EDX Images for Sub-Atomic Information, Microscopy and Microanalysis, V
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Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications · Integrated Circuits and Semiconductor Failure Analysis
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References (6)
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1. 10.1038/nphoton.2012.14810.1038/nphoton.2012.148 ↗
2. 10.1103/PhysRevB.81.10010110.1103/PhysRevB.81.100101 ↗
3. 10.1103/PhysRevB.88.11512010.1103/PhysRevB.88.115120 ↗
4. Microsc. Microanal · 2014 · 20 · 1078
5. 10.1103/PhysRevLett.112.08550110.1103/PhysRevLett.112.085501 ↗
6. 10.1126/science.114882010.1126/science.1148820 ↗