journal article·2013-08Open access

New Low Voltage Scanning Transmission Electron Microscope Detector for Fastest Image Acquisition in BF, DF and HAADF

R. Salzer, J. Ackermann, R. Arnold, S. Meyer, C. Kübler

Microscopy and Microanalysis· Volume 19· Issue S2

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Only a short abstract or summary was supplied by the source.
Source: crossref · Quality: short

Research context

OpenAlex topics: Electron and X-Ray Spectroscopy Techniques

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References

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