DataVXMicroscopy and MicroanalysisPaper
journal article·2013-08Open access

An in situ TEM Study of Ferroelastic Domain Mobility

P. Gao, J. Jokisaari, C. Nelson, S.-H. Baek, M. Trassin, C.W. Bark, R. Ramesh, C.-B. Eom, X. Pan

Microscopy and Microanalysis· Volume 19· Issue S2
Publisher pageOpen full text
Source abstract

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Only a short abstract or summary was supplied by the source.
Source: crossref · Quality: short

Research context

OpenAlex topics: Advanced Materials Characterization Techniques

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References

Reference metadata was not supplied for this record.