journal article·2013-08Open access

Post-Specimen Cc Correction Enabled Scanning Confocal Electron Energy Loss Microscopy for High-Throughput 3-D Spectroscopic Imaging of Nanomaterials

H.L. Xin, H. Zheng, P. Ercius

Microscopy and Microanalysis· Volume 19· Issue S2

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Only a short abstract or summary was supplied by the source.
Source: crossref · Quality: short

Research context

OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications · Anodic Oxide Films and Nanostructures

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References

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