Relative contrast in a-Si and c-Si in ADF-STEM imaging
Source abstract
Abstract
Z Yu, D A Muller, J Silcox; Relative contrast in a-Si and c-Si in ADF-STEM imaging, Microscopy and Microanalysis, Volume 9, Issue S02, 1 August 2003, Pages
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Integrated Circuits and Semiconductor Failure Analysis · Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques
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