Atomic Resolution Imaging of Black Spot Defects in Ion Irradiated Silicon Carbide
Source abstract
Abstract
Li He, Hao Jiang, Yizhang Zhai, Cheng Liu, Izabela Szlufarska, Beata Tyburska-Puschel, Kumar Sridharan, Paul Voyles; Atomic Resolution Imaging of Black Spo
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced ceramic materials synthesis · Semiconductor materials and devices · Integrated Circuits and Semiconductor Failure Analysis
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (4)
Show source-provided references
1. 10.1103/PhysRevB.86.14411810.1103/PhysRevB.86.144118 ↗
2. Nature Communications · 2014 · 5 · 415510.1038/ncomms5155 ↗
3. 10.1016/j.jnucmat.2007.05.01610.1016/j.jnucmat.2007.05.016 ↗
4. 10.1017/S143192761401085X10.1017/S143192761401085X ↗