Correlation of Electron Diffraction between t-EBSD in the SEM, CBED in the TEM and ACOM using ASTAR in the TEM using GaN Nanowires

Roy H. Geiss

doi:10.1017/s1431927615007035

journal article·2015-08

Correlation of Electron Diffraction between t-EBSD in the SEM, CBED in the TEM and ACOM using ASTAR in the TEM using GaN Nanowires

Roy H. Geiss

Microscopy and Microanalysis· Volume 21· Issue S3

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Nanomaterials

OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Anodic Oxide Films and Nanostructures

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References (5)

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4. 10.1111/jmi.1206510.1111/jmi.12065 ↗

5. 10.1017/S143192761006222710.1017/S1431927610062227 ↗