journal article·2013-08

Analytical STEM Study of P-Doped Silicon Nanocrystals Exhibiting Mid-Infrared Localized Surface Plasmon Resonance

J.S. Jeong, D.J. Rowe, U.R. Kortshagen, K.A. Mkhoyan

Microscopy and Microanalysis· Volume 19· Issue S2
Publisher page

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Only a short abstract or summary was supplied by the source.
Source: crossref · Quality: short

Research context

OpenAlex topics: Silicon Nanostructures and Photoluminescence · Advanced Electron Microscopy Techniques and Applications · Nanowire Synthesis and Applications

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References

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