Monte Carlo Modeling of Ion Beam Induced Secondary Electrons
Source abstract
Abstract
U Huh, W Cho, R Ramachandra, D C Joy; Monte Carlo Modeling of Ion Beam Induced Secondary Electrons, Microscopy and Microanalysis, Volume 20, Issue S3, 1 Au
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Ion-surface interactions and analysis · Plasma Diagnostics and Applications
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References
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