Firearm Serial Number Restoration with Electron Backscatter Diffraction
Source abstract
Abstract
Ryan M White, Robert R Keller; Firearm Serial Number Restoration with Electron Backscatter Diffraction, Microscopy and Microanalysis, Volume 21, Issue S3,
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Integrated Circuits and Semiconductor Failure Analysis · Ion-surface interactions and analysis · Electron and X-Ray Spectroscopy Techniques
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References (2)
Show source-provided references
1. 10.1016/S0015-7368(76)71028-410.1016/S0015-7368(76)71028-4 ↗
2. Microscopy and Microanalysis · 2010 · 16 · 1579