Atomic-Resolution Investigation of Irradiation-Induced Defects in Silicon Carbide
Source abstract
Abstract
Chad M Parish, Takaaki Koyanagi, Sosuke Kondo, Yutai Katoh; Atomic-Resolution Investigation of Irradiation-Induced Defects in Silicon Carbide, Microscopy a
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Integrated Circuits and Semiconductor Failure Analysis · Semiconductor materials and devices · Silicon and Solar Cell Technologies
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