Investigation of Electron Beam Induced Mass Loss of Embedding Media in the Low Voltage STEM
Source abstract
Abstract
Veronika Novotna, Kamila Hrubanova, Jana Nebesarova, Vladislav Krzyzanek; Investigation of Electron Beam Induced Mass Loss of Embedding Media in the Low Vo
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Integrated Circuits and Semiconductor Failure Analysis
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References
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