Atomically Resolved Scanning Confocal Electron Microscopy Using a Double Aberration-corrected Transmission Electron Microscope
Source abstract
Abstract
Peng Wang, Angus I Kirkland, Peter D Nellist, Adrian J D’Alfonso, Andrew J Morgan, Leslie J Allen, Ayako Hashimoto, Masaki Takeguchi, Kazutaka Mitsuishi, M
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Advanced Fluorescence Microscopy Techniques
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