Site Specific TEM Specimen Preparation for Characterization of Extended Defects in 4H-SiC Epilayers
Source abstract
Abstract
Mina Abadier, Rachael L Myers-Ward, Haizheng Song, D Kurt Gaskill, Chip R Eddy, Jr., Tangali S Sudarshan, Yoosuf N Picard, Marek Skowronski; Site Specific
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Silicon Carbide Semiconductor Technologies
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