Optimization of Focused Ion Beam-Tomography for Superconducting Electronics
Source abstract
Abstract
Aric Sanders, Anna Fox, Paul Dresselhaus, Alexandra Curtin; Optimization of Focused Ion Beam-Tomography for Superconducting Electronics, Microscopy and Mic
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Nuclear Physics and Applications · Electron and X-Ray Spectroscopy Techniques · X-ray Spectroscopy and Fluorescence Analysis
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References
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