Determining the Thickness of Atomically Thin MoS2 and WS2 in the TEM
Source abstract
Abstract
Ryan J Wu, Michael L Odlyzko, K Andre Mkhoyan; Determining the Thickness of Atomically Thin MoS2 and WS2 in the TEM, Microscopy and Microanalysis, Volume 20, Is
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Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: 2D Materials and Applications · MXene and MAX Phase Materials · Graphene research and applications
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