Atomic Resolution Characterization of Pt Based Bi-Metallic Nano-Catalysts Using Aberration Corrected STEM
Source abstract
Abstract
G Yang, G Hu, S Cheng, T Wagberg; Atomic Resolution Characterization of Pt Based Bi-Metallic Nano-Catalysts Using Aberration Corrected STEM, Microscopy and
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Materials Characterization Techniques · Advanced Electron Microscopy Techniques and Applications
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