The Use of a High-Resolution, High-Contrast X-ray Microscope to Probe the Internal Structure of Low Z Materials
Source abstract
Abstract
Joseph D Ferrara, Yoichi Araki, Kensaku Hamada, Kazuhiko Omote, Yoshihiro Takeda; The Use of a High-Resolution, High-Contrast X-ray Microscope to Probe the
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications · Machine Learning in Materials Science
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
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