Atomic Imaging Across Strain Boundaries in Bilayer Graphene with ADF-STEM and DF-TEM
Source abstract
Abstract
Robert Hovden, Jonathan Alden, Adam W Tsen, Pinshane Y Huang, Lola Brown, Jiwoong Park, Paul L McEuen, David A Muller; Atomic Imaging Across Strain Boundar
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Graphene research and applications · Diamond and Carbon-based Materials Research
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