Towards High Resolution in TEM and STEM: What are the Limitations and Achievements
Source abstract
Abstract
Max Haider, Stephan Uhlemann, Peter Hartel, Heiko Müller; Towards High Resolution in TEM and STEM: What are the Limitations and Achievements, Microscopy an
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Materials Characterization Techniques · Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques
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