Probing the Crystallography of Ordered Phases by coupling Orientation Microscopy and Atom Probe Tomography
Source abstract
Abstract
S Meher, P Nandwana, T Rojhirunsakool, J Tiley, R Banerjee; Probing the Crystallography of Ordered Phases by coupling Orientation Microscopy and Atom Probe
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Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Materials Characterization Techniques · Electron and X-Ray Spectroscopy Techniques · Ion-surface interactions and analysis
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References
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