Near Edge Fine Structure Analysis of Copper in Cu-Bi2Se3 Topological Insulators
Source abstract
Abstract
Ganesh Subramanian, Nan Jiang, Yulin Chen, John CH Spence; Near Edge Fine Structure Analysis of Copper in Cu-Bi2Se3 Topological Insulators, Microscopy and
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Magnetic properties of thin films · Topological Materials and Phenomena · Surface and Thin Film Phenomena
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References
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