Optical Spectroscopy Integrated with Environmental Scanning Transmission Electron Microscope: A Comprehensive In Situ Characterization Platform
Source abstract
Abstract
Matthieu Picher, Stefano Mazzucco, Steve Blankenship, Glenn Holland, Renu Sharma; Optical Spectroscopy Integrated with Environmental Scanning Transmission
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications · Surface and Thin Film Phenomena
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References
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