Ad Hoc Determination of Local Misorientations and Boundary Planes between Grains in TEM by a Dedicated Software Package Developed for the Gatan DigitalMicrograph Platform
Source abstract
Abstract
C A Wade, M Watanabe; Ad Hoc Determination of Local Misorientations and Boundary Planes between Grains in TEM by a Dedicated Software Package Developed for
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications · Surface and Thin Film Phenomena
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