journal article·2014-08Open access

Gas-Mediated Electron Beam Induced Etching - From Fundamental Physics to Device Fabrication

A. A. Martin, I. Aharonovich, M. Toth

Microscopy and Microanalysis· Volume 20· Issue S3

Abstract

A A Martin, I Aharonovich, M Toth; Gas-Mediated Electron Beam Induced Etching - From Fundamental Physics to Device Fabrication, Microscopy and Microanalysi
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Source: openalex_inverted_index · Quality: short

Research context

OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Integrated Circuits and Semiconductor Failure Analysis · Semiconductor materials and devices

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