journal article·2014-08Open access

TEM In-Situ Electrical Testing of a FIB-prepared BaTiO3 Ceramic Base Metal Electrode Capacitor

Zachary Lingley, Talin Ayvazian, Jesse Theiss, Miles Brodie, Brendan Foran

Microscopy and Microanalysis· Volume 20· Issue S3

Abstract

Zachary Lingley, Talin Ayvazian, Jesse Theiss, Miles Brodie, Brendan Foran; TEM In-Situ Electrical Testing of a FIB-prepared BaTiO3 Ceramic Base Metal Elec
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Source: openalex_inverted_index · Quality: short

Research context

OpenAlex topics: Analytical Chemistry and Sensors · Advanced Machining and Optimization Techniques · Integrated Circuits and Semiconductor Failure Analysis

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