journal article·2012-07

Direct nano-scale correlation of structural and optical properties of lattice matched AlInN/AlGaN DBRs using helium temperature scanning transmission electron microscopy cathodoluminescence

F. Bertram, J. Christen, G. Schmidt, P. Veit, C. Berger, A. Krost

Microscopy and Microanalysis· Volume 18· Issue S2
Publisher page

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Only a short abstract or summary was supplied by the source.
Source: crossref · Quality: short

Research context

OpenAlex topics: GaN-based semiconductor devices and materials · Ga2O3 and related materials · Anodic Oxide Films and Nanostructures

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References

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