journal article·2016-02

Monte Carlo Simulations of Electron Energy-Loss Spectra with the Addition of Fine Structure from Density Functional Theory Calculations

Mohammad Attarian Shandiz, Maxime J.-F. Guinel, Majid Ahmadi, Raynald Gauvin

Microscopy and Microanalysis· Volume 22· Issue 1
Publisher page

Abstract

Abstract A new approach is presented to introduce the fine structure of core-loss excitations into the electron energy-loss spectra of ionization edges by Monte Carlo simulations based on an optical oscillator model. The optical oscillator strength is refined using the calculated electron energy-loss near-edge structure by density functional theory calculations. This approach can predict the effects of multiple scattering and thickness on the fine structure of ionization edges. In addition, effects of the fitting range for background removal and the integration range under the ionization edge on signal-to-noise ratio are investigated.
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Research context

OpenAlex topics: Semiconductor materials and devices · Electron and X-Ray Spectroscopy Techniques · Analytical Chemistry and Sensors

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