Controlling Beam-Sample Interaction in Low Dimensional Materials by Low Dose Rate Electron Microscopy
Source abstract
Abstract
Christian Kisielowski, S Helveg, L Hansen, P Specht; Controlling Beam-Sample Interaction in Low Dimensional Materials by Low Dose Rate Electron Microscopy,
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications · Anodic Oxide Films and Nanostructures
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (4)
Show source-provided references
1. 10.1016/j.micron.2014.07.01010.1016/j.micron.2014.07.010 ↗
2. 10.1016/j.micron.2014.07.00910.1016/j.micron.2014.07.009 ↗
3. 10.1103/PhysRevLett.106.12610210.1103/PhysRevLett.106.126102 ↗
4. Phys Rev. B · 2013 · 88 · 024305