Evaluation of Tip Performance by XE-100 Atomic Force Microscopy (AFM)
Source abstract
Abstract
Jun S Lee, Joonhyung Kwon, Sang-il Park, Changmo Sung; Evaluation of Tip Performance by XE-100 Atomic Force Microscopy (AFM), Microscopy and Microanalysis,
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Force Microscopy Techniques and Applications · Adhesion, Friction, and Surface Interactions · Advanced Measurement and Metrology Techniques
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References
Reference metadata was not supplied for this record.