Auger Analysis Of Focused Ion Beam Prepared Lift -Out Specimens
Source abstract
Abstract
BB Rossie, R M Mills, SD Anderson, M Antonell, FA Stevie; Auger Analysis Of Focused Ion Beam Prepared Lift -Out Specimens, Microscopy and Microanalysis, Vo
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Ion-surface interactions and analysis · Integrated Circuits and Semiconductor Failure Analysis
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References
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