Calibration of Image Analysis Systems for Statistically Demanding QM Applications
Source abstract
Abstract
Journal Article Calibration of Image Analysis Systems for Statistically Demanding QM Applications Get access Barry M Jenkins Barry M Jenkins Jenkins-Kwan Technology Pty. Ltd., Queensland Centre for Advanced Technologies, PO Box 883, Kenmore, QLD 4069, Australia Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 9, Issue S02, 1 August 2003, Pages 750–751, https://doi.org/10.1017/S1431927603443754 Published: 21 July 2003
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Non-Destructive Testing Techniques · Industrial Vision Systems and Defect Detection
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References
Reference metadata was not supplied for this record.