Scanning Probe Microscopy in TEM : an In-situ Approach for Nano-scale Property Measurements

Property characterization of nanomaterials is challenged by the small size of the structure because of the difficulties in manipulation. Here we demonstrate a novel approach that allows a direct measurement of the mechanical properties, the electron field emission and the ballistic quantum conductance in individual nanotubes and nanowires by an conjunction operation of scanning probe microscopy in transmission electron microscopy (TEM). The technique is powerful in a way that it can directly correlate the atomic-scale microstructure of the carbon nanotube with its physical properties, providing a one-to-one correspondence in structure-property characterization.