Applications of Focused Ion Beam Using FEI DualBeam DB235: How Deep Is How Small a Hole? & How to Drill It Deeper & Smaller?
Source abstract
Abstract
Warren J MoberlyChan, Erik J Sanchez, Peter R H Stark, John T Krug; Applications of Focused Ion Beam Using FEI DualBeam DB235: How Deep Is How Small a Hole
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Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications · Integrated Circuits and Semiconductor Failure Analysis
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