journal article·2015-08Open access

Improved Low Voltage SEM Image Resolution Through the Use of Image Restoration Techniques

Matthew D. Zotta, Yudhishthir P. Kandel, Andrew N. Caferra, Eric Lifshin

Microscopy and Microanalysis· Volume 21· Issue S3

Abstract

Matthew D Zotta, Yudhishthir P Kandel, Andrew N Caferra, Eric Lifshin; Improved Low Voltage SEM Image Resolution Through the Use of Image Restoration Techn
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short

Research context

OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advancements in Photolithography Techniques · Integrated Circuits and Semiconductor Failure Analysis

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References (4)

Show source-provided references
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2. Microscopy and Microanalysis · 2014 · 20 · 78
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4. 10.1046/j.1365-2818.2002.01062.x10.1046/j.1365-2818.2002.01062.x ↗