AFM / SEM Backscattered Imaging of Slip Bands in Titanium
Source abstract
Abstract
Journal Article AFM / SEM Backscattered Imaging of Slip Bands in Titanium Get access S Okerstrom S Okerstrom Medtronic Inc., 7000 Central Ave. NE, Minneapolis, MN 55432 Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 8, Issue S02, 1 August 2002, Pages 782–783, https://doi.org/10.1017/S1431927602105587 Published: 01 August 2002
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Force Microscopy Techniques and Applications · Ultrasonics and Acoustic Wave Propagation · Microstructure and mechanical properties
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