DataVXMicroscopy and MicroanalysisPaper
journal article·2010-07Open access

(Scanning) Transmission Electron Microscope Study on the Misfit Layer Compounds (NbSe2)4(PbSe)4

S Xie, NT Nguyen, DC Johnson

Microscopy and Microanalysis· Volume 16· Issue S2
Publisher pageOpen full text
Source abstract

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.
Only a short abstract or summary was supplied by the source.
Source: crossref · Quality: short

Research context

OpenAlex topics: Chalcogenide Semiconductor Thin Films

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References

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