DataVXMicroscopy and MicroanalysisPaper
journal article·2004-08

Silicon Drift Detectors for Fast and High Resolution Element Detection in Micro-Beam Analysis

Heike Soltau, Peter Lechner, Gerhard Lutz, Lothar Strüder, Carlo Fiorini, Antonio Longoni, Rouven Eckhard, Andreas Pahlke, Martina Schnecke, Gerhard Schaller, Florian Schopper

Microscopy and Microanalysis· Volume 10· Issue S02
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Source abstract

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.
Only a short abstract or summary was supplied by the source.
Source: crossref · Quality: short

Research context

OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Ion-surface interactions and analysis · Nuclear Physics and Applications

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References

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