EBSD Performed “In-Situ” on a Dual-Beam FIB
Source abstract
Abstract
JK Farrer, MC Chipman, M Tiner; EBSD Performed “In-Situ” on a Dual-Beam FIB, Microscopy and Microanalysis, Volume 8, Issue S02, 1 August 2002, Pages 544–54
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Integrated Circuits and Semiconductor Failure Analysis · Non-Destructive Testing Techniques · Advanced Surface Polishing Techniques
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References
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