DataVXMicroscopy and MicroanalysisPaper
journal article·2010-07Open access

TEM Analysis of Pulse Laser Deposited BaFe12O19 Films on SiC

VK Lazarov, Z Cai, K Yoshida, P Hasnip, KS Ziemer

Microscopy and Microanalysis· Volume 16· Issue S2
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Source abstract

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.
Only a short abstract or summary was supplied by the source.
Source: crossref · Quality: short

Research context

OpenAlex topics: Advanced Materials Characterization Techniques · Electron and X-Ray Spectroscopy Techniques · Advanced Surface Polishing Techniques

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