Chemical Analysis with Single Atom Sensitivity Using Aberration-Corrected STEM
Source abstract
Abstract
Robert F Klie, Ahmet Gulec, JingJing Liu, Tadas Paulauskas, Patrick J Phillips, Canhui Wang, Randall J Meyer; Chemical Analysis with Single Atom Sensitivit
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Surface and Thin Film Phenomena
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References
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