New Approaches for Measuring Electrostatic Potentials and Charge Density Distributions in Working Devices Using Off-Axis and In-Line Electron Holography
Source abstract
Abstract
Rafal E Dunin-Borkowski, Vadim Migunov, Andrew London, Michael Farle, Amir H Tavabi, Giulio Pozzi; New Approaches for Measuring Electrostatic Potentials an
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Surface and Thin Film Phenomena · Non-Destructive Testing Techniques
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