DataVXMicroscopy and MicroanalysisPaper
journal article·2009-07

Tomography of Biological Materials using Focused Ion Beam Sectioning and Backscattered Electron Imaging

DAM de Winter, CTWM Schneijdenberg, MN Lebbink, LHP Hekking, JA Post, B Lich, AJ Verkleij, MM Drury, BM Humbel

Microscopy and Microanalysis· Volume 15· Issue S2
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Source abstract

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Only a short abstract or summary was supplied by the source.
Source: crossref · Quality: short

Research context

OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Nuclear Physics and Applications · Advanced Electron Microscopy Techniques and Applications

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