Current and Future Developments in order to Approach a Point Resolution of dpr ~ 0.5 Å with a TEM
Source abstract
Abstract
Journal Article Current and Future Developments in order to Approach a Point Resolution of dpr ~ 0.5 Å with a TEM Get access Max Haider Max Haider CEOS GmbH, Englerstr. 28, D-69126 Heidelberg, Germany Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 9, Issue S02, 1 August 2003, Pages 930–931, https://doi.org/10.1017/S1431927603444656 Published: 01 August 2003
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Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Advanced Materials Characterization Techniques
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