Large Solid Angle Silicon Drift Detectors for EDX Analysis in TEM
Source abstract
Abstract
A Niculae, M Bornschlegl, R Eckhardt, J Herrmann, S Jeschke, G Krenz, A Liebel, G Lutz, H Soltau, L Strüder; Large Solid Angle Silicon Drift Detectors for
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Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications · Semiconductor materials and devices
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