Using Bethe Potentials in the Scattering Matrix for Defect Image Simulations
Source abstract
Abstract
A Wang, M De Graef; Using Bethe Potentials in the Scattering Matrix for Defect Image Simulations, Microscopy and Microanalysis, Volume 20, Issue S3, 1 Augu
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Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Non-Destructive Testing Techniques
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