journal article·2009-07

Study of Compositional Gradients Across the γ/γ Interface in Ni-base Superalloys Using 3D Atom Probe Tomography

JY Hwang, S Nag, ARP Singh, GB Viswanathan, J Tiley, R Srinivasan, HL Fraser, R Banerjee

Microscopy and Microanalysis· Volume 15· Issue S2
Publisher page

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Only a short abstract or summary was supplied by the source.
Source: crossref · Quality: short

Research context

OpenAlex topics: Advanced Materials Characterization Techniques · Additive Manufacturing Materials and Processes · High Temperature Alloys and Creep

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References

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